EDN

FormFactor probe card targets 300-mm DRAM wafer test

Harmony eXP, a full-wafer-contact probe card from FormFactor, can test more than 1000 DRAM devices per touchdown and is capable (for some device designs) of supporting one-touchdown testing of a full ...

Rohde & Schwarz Joins FormFactor’s MeasureOne Partner Program, Advancing Their Partnership in On-Wafer RF Component Characterization

(NASDAQ: FORM), a leading provider of RF probe stations and probe cards, and Rohde & Schwarz, a global leader in test and measurement, today announced a strategic co-marketing partnership as part of ...
EDN

Wafer probe cards lower wire-bond logic, SoC test costs

Livermore, Calif.—FormFactor Inc. has developed a family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and ...
Nasdaq

New SmartMatrix™ 3000XP Probe Card Lowers DRAM Test Costs by More than 25%

LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...
WGHP

Global Wafer Test Probe Card Market to reach USD 3.88 billion by 2028

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...
Electronics360

Three big semiconductor test probe challenges

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...
Nasdaq

FormFactor Opens New Manufacturing Facility to Expand Capacity for Semiconductor Wafer Probe Card Production

LIVERMORE, Calif., Dec. 15, 2021 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), a leading semiconductor test and measurement supplier, today announced the ...
Electronic Design

New DRAMs Shake Up Wafer Probe

Over the past 10 years, the DRAM market has been one of the toughest commodity businesses in the electronics industry. Bit growth has averaged more than 60% per year, but at the same time, cycles of ...
Optics

RoodMicrotec using Jenoptik’s UFO Probe Card to test clients’ PIC wafers

Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the ...
Electronic Design

11,000-Probe Card Tests 300-mm DRAMs In Only Six Touchdowns

Based on FormFactor's scalable MicroSpring interconnect technology, the PH150 probe card enables the testing of 300-mm DRAM wafers in just six touchdowns. The ability to test a wafer in fewer ...
Optics

RoodMicrotec using Jenoptik’s UFO Probe Card to test clients’ PIC wafers

Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the ...